Cited by 800Machine Learning and Data ClassificationImbalanced Data Classification TechniquesMachine Learning and Algorithms

Learning and evaluating classifiers under sample selection bias

Zadrozny, Bianca·2004·Twenty-first international conference on Machine learning - ICML '04

Abstract

Classifier learning methods commonly assume that the training data consist of randomly drawn examples from the same distribution as the test examples about which the learned model is expected to make predictions. In many practical situations, however, this assumption is violated, in a problem known in econometrics as sample selection bias. In this paper, we formalize the sample selection bias problem in machine learning terms and study analytically and experimentally how a number of well-known classifier learning methods are affected by it. We also present a bias correction method that is particularly useful for classifier evaluation under sample selection bias.

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Crossref · 10.1145/1015330.1015425

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  • Prior work on detecting discrimination has focused on measuring correlation or mutual information between inputs and outputs, discrepancies in fractions of inputs that produce a given output, or discrepancies in output probability distributions.

    “Prior work on detecting discrimination has focused on measuring correlation or mutual information between inputs and outputs [79], discrepancies in the fractions of inputs that produce a given output [18, 19, 39-42, 87-89, 91], or discrepancies in output probability distributions [51].”

    From Fairness testing: testing software for discrimination (2017) · cites this paper as [88]

  • Reducing discrimination (CV score) in classifiers often fails to remove causal discrimination and discrimination against certain groups.

    “Reducing discrimination (CV score) in classifiers [18, 40, 88, 91], as our evaluation has shown, often fails to remove causal discrimination and discrimination against certain groups.”

    From Fairness testing: testing software for discrimination (2017) · cites this paper as [88]

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Authors
Zadrozny, B.
Affiliations
IBM (United States) (US)
Corresponding author
Zadrozny, Bianca
Venue
Twenty-first international conference on Machine learning - ICML '04
Publisher
ACM Press
Published
2004
Pages
114
OpenAlex
W2032536435
Cited by
800
References
17
Citations by year
2026: 13 · 2025: 19 · 2024: 25 · 2023: 42 · 2022: 55 · 2021: 76 · 2020: 109 · 2019: 49 · 2018: 63 · 2017: 35 · 2016: 37 · 2015: 45 · 2014: 33 · 2013: 29 · 2012: 31
Type
conference abstract
Language
en
Open access
closed
Locations
International Conference on Machine Learning (publishedVersion)
Topics
  • Physical Sciences › Computer Science › Artificial Intelligence › Machine Learning and Data Classification
  • Physical Sciences › Computer Science › Artificial Intelligence › Imbalanced Data Classification Techniques
  • Physical Sciences › Computer Science › Artificial Intelligence › Machine Learning and Algorithms
Keywords
sample selection bias, classifier training, classifier evaluation, bias correction, training data distribution, econometrics

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