Cited by 58Advanced Semiconductor Detectors and MaterialsSpectroscopy and Laser ApplicationsInfrared Target Detection Methodologies

Single-defect spectroscopy in the shortwave infrared

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Wu, Xiaojian, Kim, Mijin, Qu, Haoran, Wang, YuHuang·2019·Nature Communications

Abstract

Chemical defects that fluoresce in the shortwave infrared open exciting opportunities in deep-penetration bioimaging, chemically specific sensing, and quantum technologies. However, the atomic size of defects and the high noise of infrared detectors have posed significant challenges to the studies of these unique emitters. Here we demonstrate high throughput single-defect spectroscopy in the shortwave infrared capable of quantitatively and spectrally resolving chemical defects at the single defect level. By cooling an InGaAs detector array down to −190 °C and implementing a nondestructive readout scheme, we are able to capture low light fluorescent events in the shortwave infrared with a signal-to-noise ratio improved by more than three orders-of-magnitude. As a demonstration, we show it is possible to resolve individual chemical defects in carbon nanotube semiconductors, simultaneously collecting a full spectrum for each defect within the entire field of view at the single defect limit.

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  1. [1]Collins, P. G. in Oxford Handbook of Nanoscience and Technology (eds Narlikar, A. V. & Fu, Y. Y.) (Oxford University Press, Oxford, UK, 2010).

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Authors
Wu, X., Kim, M., Qu, H., & Wang, Y.
Affiliations
University of Maryland, College Park (US)
Corresponding author
Wang, YuHuang
Venue
Nature Communications
Published
2019-06-17
Volume
10
Issue
1
Pages
2672-2672
ISSN
2041-1723 (ISSN-L)
OpenAlex
W2949192847
Cited by
58
References
36
Citations by year
2026: 5 · 2025: 6 · 2024: 3 · 2023: 4 · 2022: 12 · 2021: 15 · 2020: 7 · 2019: 6
FWCI
3.59
Type
journal article
Language
en
Open access
Locations
  • Nature Communications (publishedVersion, cc-by)
  • PubMed Central (publishedVersion, cc-by)
  • PubMed (publishedVersion)
  • RePEc: Research Papers in Economics (submittedVersion)
  • DOAJ (DOAJ: Directory of Open Access Journals) (submittedVersion, cc-by-sa)
  • DOAJ (DOAJ: Directory of Open Access Journals) (submittedVersion)
  • OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information) (submittedVersion)
Funders
  • U.S. Department of Health & Human Services | NIH | National Institute of General Medical Sciences (R01GM114167)
  • U.S. Department of Energy (DE-SC0019112)
  • National Science Foundation (CHE-1904488)
Topics
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Advanced Semiconductor Detectors and Materials
  • Physical Sciences › Chemistry › Spectroscopy › Spectroscopy and Laser Applications
  • Physical Sciences › Engineering › Aerospace Engineering › Infrared Target Detection Methodologies
Keywords
shortwave infrared, infrared fluorescence, chemical defects, nondestructive readout, signal-to-noise ratio, defect quantification, infrared detection

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