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Characterization, Modeling, and Application of 10-kV SiC MOSFET

Wang, Jun, Zhao, Tiefu, Li, Jun, Huang, Alex Q., Callanan, Robert, Husna, Fatima, Agarwal, Anant·2008·IEEE Transactions on Electron Devices

Abstract

Ten-kilovolt SiC MOSFETs are currently under development by a number of organizations in the United States, with the aim of enabling their applications in high-voltage high-frequency power conversions. The aim of this paper is to obtain the key device characteristics of SiC MOSFETs so that their realistic application prospect can be provided. In particular, the emphasis is on obtaining their losses in various operation conditions from the extensive characterization study and a proposed behavioral SPICE model. Using the validated MOSFET SPICE model, a 20-kHz 370-W dc/dc boost converter based on a 10-kV 4H-SiC DMOSFET and diodes is designed and experimentally demonstrated. In the steady state of the boost converter, the total power loss in the 15.45-mm2SiC MOSFET is 23.6 W for the input power of 428 W. The characterization study of the experimental SiC MOSFET and the experiment of the SiC MOSFET-based boost converter indicate that the turn-on losses of SiC MOSFETs are the dominant factors in determining their maximum operation frequency in hard-switched circuits with conventional thermal management. Replacing a 10-kV SiC PiN diode with a 10-kV SiC JBS diode as a boost diode and using a small external gate resistor, the turn-on loss of the SiC MOSFET can be reduced, and the 10-kV 5-A SiC MOSFET-based boost converter is predicted to be capable of a 20-kHz operation with a 5-kV dc output voltage and a 1.25-kW output power by the PSpice simulation with the MOSFET model. The low losses and fast switching speed of 10-kV SiC MOSFETs shown in the characterization study and the preliminary demonstration of the boost converter make them attractive in high-frequency high-voltage power-conversion applications.

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Metadata

Authors
Wang, J., Zhao, T., Li, J., Huang, A. Q., Callanan, R., Husna, F., & Agarwal, A.
Venue
IEEE Transactions on Electron Devices
Published
2008-08
Volume
55
Issue
8
Pages
1798-1806
ISSN
0018-9383 (ISSN-L)
OpenAlex
W2122579082
Cited by
398
References
16
FWCI
6.57
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Characterization, Modeling, and Application of 10-kV SiC MOSFET. https://app.cochat.ai/papers/10.1109/ted.2008.926650
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Wang, J., Zhao, T., Li, J., Huang, A. Q., Callanan, R., Husna, F., & Agarwal, A. (2008). Characterization, Modeling, and Application of 10-kV SiC MOSFET. IEEE Transactions on Electron Devices. https://doi.org/10.1109/ted.2008.926650

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