T-ray tomography
Abstract
We demonstrate tomographic T-ray imaging, using the timing information present in terahertz (THz) pulses in a reflection geometry. THz pulses are reflected from refractive-index discontinuities inside an object, and the time delays of these pulses are used to determine the positions of the discontinuities along the propagation direction. In this fashion a tomographic image can be constructed.
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Terahertz nondestructive testing can measure the thickness of common plastics and paint layers.
“Thus, THz nondestructive testing can be used to determine the thickness of common plastics 1 and paint layers. 2”
From Highly sensitive terahertz measurement of layer thickness using a two-cylinder waveguide sensor (2010) · cites this paper as [1]
Terahertz radiation passes efficiently through most dielectric materials.
“The terahertz ͑THz͒ frequency band ͑located between 100 GHz and 10 THz, corresponding to wavelengths between 3000 and 30 m in free-space͒ efficiently penetrates most dielectrics.”
From Highly sensitive terahertz measurement of layer thickness using a two-cylinder waveguide sensor (2010) · cites this paper as [1]
Cites
Principles of Computerized Tomographic Imaging
Kak, A. C., & Slaney, M. (2001) · doi:10.1137/1.9780898719277 · Cited by 5,809 · see citing works
Far-infrared time-domain spectroscopy with terahertz beams of dielectrics and semiconductors
Grischkowsky, D., Keiding, S., van Exter, M., & Fattinger, C. (1990) · Journal of the Optical Society of America B · doi:10.1364/josab.7.002006 · Cited by 2,239 · see citing works
Hu, B., & Nuss, M. C. (1995) · Optics Letters · doi:10.1364/ol.20.001716 · Cited by 1,643 · see citing works
Self-citationTerahertz time-domain spectroscopy of water vapor
van Exter, M., Fattinger, C., & Grischkowsky, D. (1989) · Optics Letters · doi:10.1364/ol.14.001128 · Cited by 862 · see citing works
Mittleman, D. M., Jacobsen, R. H., & Nuss, M. C. (1996) · IEEE Journal of Selected Topics in Quantum Electronics · doi:10.1109/2944.571768 · Cited by 813 · see citing works
Self-citationChemical recognition of gases and gas mixtures with terahertz waves
Jacobsen, R. H., Mittleman, D. M., & Nuss, M. C. (1996) · Optics Letters · doi:10.1364/ol.21.002011 · Cited by 196 · see citing works
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Terahertz spectroscopy and imaging - Modern techniques and applications
Jepsen, P. U., Cooke, D. G., & Koch, M. (2011) · Laser & Photonics Reviews · doi:10.1002/lpor.201000011 · Cited by 2,091 · see citing works
THz imaging and sensing for security applications—explosives, weapons and drugs
Federici, J. F., Schulkin, B., Huang, F., Gary, D., Barat, R., Oliveira, F., & Zimdars, D. (2005) · Semiconductor Science and Technology · doi:10.1088/0268-1242/20/7/018 · Cited by 1,756 · see citing works
Material parameter estimation with terahertz time-domain spectroscopy
Dorney, T. D., Baraniuk, R. G., & Mittleman, D. M. (2001) · Journal of the Optical Society of America A · doi:10.1364/josaa.18.001562 · Cited by 807 · see citing works
Self-citationBaxter, J. B., & Guglietta, G. W. (2011) · Analytical Chemistry · doi:10.1021/ac200907z · Cited by 477 · see citing works
Detectors and sources for ultrabroadband electro-optic sampling: Experiment and theory
Leitenstorfer, A., Hunsche, S., Shah, J., Nuss, M. C., & Knox, W. H. (1999) · Applied Physics Letters · doi:10.1063/1.123601 · Cited by 461 · see citing works
Self-citationTerahertz paintmeter for noncontact monitoring of thickness and drying progress in paint film
Yasui, T., Yasuda, T., Sawanaka, K.-I., & Araki, T. (2005) · Applied Optics · doi:10.1364/ao.44.006849 · Cited by 273 · see citing works
Withayachumnankul, W., Png, G. M., Yin, X., Atakaramians, S., Jones, I., Lin, H., Ung, B. S. Y., Balakrishnan, J., Ng, B. W.-H., Ferguson, B., et al. (2007) · Proceedings of the IEEE · doi:10.1109/jproc.2007.900325 · Cited by 179 · see citing works
TeraHertz imaging of hidden paint layers on canvas
Adam, A. J. L., Planken, P. C. M., Meloni, S., & Dik, J. (2009) · Optics Express · doi:10.1364/oe.17.003407 · Cited by 155 · see citing works
Component spatial pattern analysis of chemicals using terahertz spectroscopic imaging
Watanabe, Y., Kawase, K., Ikari, T., Ito, H., Ishikawa, Y., & Minamide, H. (2003) · Applied Physics Letters · doi:10.1063/1.1595132 · Cited by 140 · see citing works
Wang, S., Ferguson, B., Abbott, D., & Zhang, X.-C. (2003) · Journal of Biological Physics · doi:10.1023/a:1024457212578 · Cited by 119 · see citing works
Willis, K. J., Hagness, S. C., & Knezevic, I. (2013) · Applied Physics Letters · doi:10.1063/1.4798658 · Cited by 60 · see citing works
Accuracy of sample material parameters reconstruction using terahertz pulsed spectroscopy
Zaytsev, K. I., Gavdush, A. A., Karasik, V. E., Alekhnovich, V. I., Nosov, P. A., Lazarev, V. A., Reshetov, I. V., & Yurchenko, S. O. (2014) · Journal of Applied Physics · doi:10.1063/1.4876324 · Cited by 53 · see citing works
Highly sensitive terahertz measurement of layer thickness using a two-cylinder waveguide sensor
Theuer, M., Beigang, R., & Grischkowsky, D. (2010) · Applied Physics Letters · doi:10.1063/1.3481080 · Cited by 38 · see citing works
Sensitivity increase for coating thickness determination using THz waveguides
Theuer, M., Beigang, R., & Grischkowsky, D. (2010) · Optics Express · doi:10.1364/oe.18.011456 · Cited by 16 · see citing works
Feature extraction without phase error for THz reflective spectroscopy
Zhang, L., Zhong, H., Zhu, D., Zuo, J., & Zhang, C. (2012) · Science China Information Sciences · doi:10.1007/s11432-011-4519-x · Cited by 5 · see citing works
- Authors
- Mittleman, D. M., Hunsche, S., Boivin, L., & Nuss, M. C.
- Corresponding author
- Mittleman, Daniel M.
- Hunsche, Stefan
- Boivin, Luc
- Nuss, Martin C.
- Venue
- Optics Letters
- Publisher
- Optica Publishing Group
- Published
- 1997-06-15
- Volume
- 22
- Issue
- 12
- Pages
- 904
- ISSN
- 0146-9592 (ISSN-L)
- 1539-4794
- OpenAlex
- W2520049440
- Cited by
- 519
- References
- 6
- Citations by year
- 2026: 6 · 2025: 11 · 2024: 10 · 2023: 14 · 2022: 13 · 2021: 14 · 2020: 16 · 2019: 8 · 2018: 22 · 2017: 16 · 2016: 17 · 2015: 21 · 2014: 22 · 2013: 22 · 2012: 19
- FWCI
- 15.55
- Type
- journal article
- Language
- en
- Open access
- closed
- Locations
- Optics Letters (publishedVersion)
- PubMed (publishedVersion)
- Topics
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Terahertz technology and applications
- Physical Sciences › Physics and Astronomy › Radiation › Advanced X-ray Imaging Techniques
- Physical Sciences › Engineering › Mechanics of Materials › Thermography and Photoacoustic Techniques
- Keywords
- terahertz tomography, terahertz imaging, refractive index discontinuity, reflection geometry, pulse timing, refractive index reconstruction
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