Experimental Techniques for Thin-Film Thermal Conductivity Characterization
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Electrical resistance thermometry has been applied to measure the thermal conductivity of low-dimensional solids in both direct and modulated current configurations.
“Electrical resistance thermometry has been applied to measure the thermal conductivity of low dimensional solids (films, membranes, wires, and bridges) [13-15] in both direct [16-20] and modulated (1-omega, 2-omega, 3-omega) [21,22] current configurations.”
From Mean Free Path Effects on the Experimentally Measured Thermal Conductivity of Single-Crystal Silicon Microbridges (2013) · cites this paper as [14]
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Characterisation of advanced thermoelectric materials and devices
Ghaderi, S. (2020)
- Authors
- Borca-Tasciuc, T., & Chen, G.
- Affiliations
- Massachusetts Institute of Technology (US)
- ORCID
- Chen, G.
- Venue
- Physics of Solids and Liquids
- Publisher
- Springer US
- Published
- 2006-10-01
- Pages
- 205-237
- OpenAlex
- W207909
- Cited by
- 23
- References
- 86
- Citations by year
- 2022: 2 · 2021: 1 · 2020: 2 · 2019: 2 · 2018: 2 · 2017: 2 · 2016: 3 · 2015: 1 · 2014: 1 · 2013: 4 · 2012: 2
- FWCI
- 1.17
- Type
- book chapter
- Language
- en
- Open access
- closed
- Locations
- Springer eBooks (publishedVersion)
- Topics
- Physical Sciences › Materials Science › Materials Chemistry › Thermal properties of materials
- Physical Sciences › Engineering › Computational Mechanics › Heat Transfer and Numerical Methods
- Physical Sciences › Engineering › Mechanics of Materials › Thermography and Photoacoustic Techniques
- Keywords
- thin films, thermal conductivity, thermal conductivity measurement
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Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
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