Understanding and eliminating artifact signals from diffusely scattered pump beam in measurements of rough samples by time-domain thermoreflectance (TDTR)
Abstract
Time-domain thermoreflectance (TDTR) is a pump-probe technique frequently applied to measure the thermal transport properties of bulk materials, nanostructures, and interfaces. One of the limitations of TDTR is that it can only be employed to samples with a fairly smooth surface. For rough samples, artifact signals are collected when the pump beam in TDTR measurements is diffusely scattered by the rough surface into the photodetector, rendering the TDTR measurements invalid. In this paper, we systemically studied the factors affecting the artifact signals due to the pump beam leaked into the photodetector and thus established the origin of the artifact signals. We find that signals from the leaked pump beam are modulated by the probe beam due to the phase rotation induced in the photodetector by the illumination of the probe beam. As a result of the modulation, artifact signals due to the leaked pump beam are registered in TDTR measurements as the out-of-phase signals. We then developed a simple approach to eliminate the artifact signals due to the leaked pump beam. We verify our leak-pump correction approach by measuring the thermal conductivity of a rough InN sample, when the signals from the leaked pump beam are significant. We also discuss the advantages of our new method over the two-tint approach and its limitations. Our new approach enables measurements of the thermal conductivity of rough samples using TDTR.
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The two-tint method has a high demand on laser stability in both intensity and wavelength; otherwise fluctuations in laser wavelength translate into fluctuations in the power intensities of the pump and probe beams and appear as noise in TDTR measurements.
“In addition, the two-tint method has a high demand on the laser stability in both the intensity and the wavelength (like the one reported in Ref. 23 ). Otherwise, the fluctuations in the laser wavelength would translate into fluctuations in the power intensities of the pump and probe beams and appear as noise in TDTR measurements (like the one reported in Ref. 95 ).”
From Tutorial: Time-domain thermoreflectance (TDTR) for thermal property characterization of bulk and thin film materials (2018) · cites this paper as [95]
Due to the small thermoreflectance coefficient dR/dT (~10−4 K−1), a tiny amount of reflected pump beam even with an intensity less than 0.01% of the reflected probe beam is significant enough to distort TDTR measurements.
“However, due to the small value of thermoreflectance coefficient d R /d T (~ 10 -4 K -1 ), a tiny amount of reflected pump beam even with an intensity less than 0.01% of the reflected probe beam is significant enough to distort the TDTR measurements. 95”
From Tutorial: Time-domain thermoreflectance (TDTR) for thermal property characterization of bulk and thin film materials (2018) · cites this paper as [95]
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Self-citation
- Authors
- Sun, B., & Koh, Y. K.
- Affiliations
- National University of Singapore (SG)
- ORCID
- Venue
- Review of Scientific Instruments
- Publisher
- AIP Publishing
- Published
- 2016-06-01
- Volume
- 87
- Issue
- 6
- Pages
- 064901-064901
- ISSN
- 0034-6748 (ISSN-L)
- 1089-7623
- OpenAlex
- W2416148814
- Cited by
- 57
- References
- 24
- Citations by year
- 2026: 3 · 2025: 13 · 2024: 7 · 2023: 7 · 2022: 6 · 2021: 4 · 2020: 5 · 2019: 2 · 2018: 5 · 2017: 3 · 2016: 2
- FWCI
- 1.78
- Type
- journal article
- Language
- en
- Open access
- closed
- Locations
- Review of Scientific Instruments (publishedVersion)
- PubMed (publishedVersion)
- Funders
- National University of Singapore
- Topics
- Physical Sciences › Materials Science › Materials Chemistry › Thermal properties of materials
- Physical Sciences › Engineering › Mechanics of Materials › Thermography and Photoacoustic Techniques
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Terahertz technology and applications
- Keywords
- time-domain thermoreflectance, rough surfaces, thermal conductivity measurement, inns, thermal transport properties
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