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Cited by 5,290

The DOI matches its Crossref record; 3 of the 3 references it cites were found in a registry or an index.

On combining classifiers

Kittler, J., Hatef, M., Duin, R.P.W., Matas, J.·1998·IEEE Transactions on Pattern Analysis and Machine Intelligence

Abstract

We develop a common theoretical framework for combining classifiers which use distinct pattern representations and show that many existing schemes can be considered as special cases of compound classification where all the pattern representations are used jointly to make a decision. An experimental comparison of various classifier combination schemes demonstrates that the combination rule developed under the most restrictive assumptions-the sum rule-outperforms other classifier combinations schemes. A sensitivity analysis of the various schemes to estimation errors is carried out to show that this finding can be justified theoretically.

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Metadata

Authors
Kittler, J., Hatef, M., Duin, R. P. W., & Matas, J.
Venue
IEEE Transactions on Pattern Analysis and Machine Intelligence
Published
1998-03
Volume
20
Issue
3
Pages
226-239
ISSN
0162-8828 (ISSN-L)
OpenAlex
W2158275940
Cited by
5,290
References
3
FWCI
66.08
Type
journal article
Language
en
Open access
closed

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