Thermal conductance of interfaces with amorphous SiO 2 measured by time-resolved magneto-optic Kerr-effect thermometry
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We use time-resolved magneto-optic Kerr effect and ultrathin Co/Pt transducer films to perform thermal-transport experiments with higher sensitivity and greater time resolution than typically available in studies of interfacial thermal transport by time-domain thermoreflectance. We measure the interface conductance between Pt and amorphous ${\mathrm{SiO}}_{2}$ using Pt/Co/Pt ferromagnetic transducer films with thicknesses between 4.2 and 8.2 nm and find an average value of ${G}_{\mathrm{Pt}}\ensuremath{\approx}0.3\phantom{\rule{4pt}{0ex}}\mathrm{GW}\phantom{\rule{4pt}{0ex}}{\mathrm{m}}^{\ensuremath{-}2}\phantom{\rule{4pt}{0ex}}{\mathrm{K}}^{\ensuremath{-}1}$. This result demonstrates that interfaces between metals and amorphous dielectrics can have a conductance corresponding to Kapitza lengths of the order of 4 nm, and are thus of relevance when engineering nanoscale devices. For thin ${\mathrm{SiO}}_{2}$ layers, our method also provides sensitivity to the interface conductance between ${\mathrm{SiO}}_{2}$ and Si and we find ${G}_{\mathrm{Si}}=0.6\phantom{\rule{4pt}{0ex}}\mathrm{GW}\phantom{\rule{4pt}{0ex}}{\mathrm{m}}^{\ensuremath{-}2}\phantom{\rule{4pt}{0ex}}{\mathrm{K}}^{\ensuremath{-}1}$ as the lower limit.
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The small thermal mass of the transducer layer also enables enhanced sensitivity to the interface thermal conductance when the thermal conductivity of the substrate is small.
“Meanwhile, the small thermal mass of the transducer layer also enables an enhanced sensitivity to the interface thermal conductance 150 when the thermal conductivity of the substrate is small.”
From Tutorial: Time-domain thermoreflectance (TDTR) for thermal property characterization of bulk and thin film materials (2018) · cites this paper as [150]
TDTR can incorporate a temperature sensing technique utilizing time-resolved magneto-optic Kerr effect (TR-MOKE).
“TDTR can also incorporate a novel temperature sensing technique utilizing time-resolved magneto-optic Kerr effect (TR-MOKE). 34, 149, 150”
From Tutorial: Time-domain thermoreflectance (TDTR) for thermal property characterization of bulk and thin film materials (2018) · cites this paper as [150]
Magnetic transducers as thin as 4.2 nm have been used for TR-MOKE experiments.
“Magnetic transducers as thin as 4.2 nm were also used for TR-MOKE experiments. 150”
From Tutorial: Time-domain thermoreflectance (TDTR) for thermal property characterization of bulk and thin film materials (2018) · cites this paper as [150]
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- Authors
- Kimling, J., Philippi-Kobs, A., Jacobsohn, J., Oepen, H. P., & Cahill, D. G.
- Affiliations
- University of Illinois Urbana-Champaign (US)
- Universität Hamburg (DE)
- ORCID
- Cahill, David G.
- Venue
- Physical Review B
- Publisher
- American Physical Society (APS)
- Published
- 2017-05-22
- Volume
- 95
- Issue
- 18
- ISSN
- 2469-9950 (ISSN-L)
- 2469-9969
- OpenAlex
- W2617091909
- Cited by
- 76
- References
- 37
- Citations by year
- 2026: 14 · 2025: 7 · 2024: 8 · 2023: 6 · 2022: 9 · 2021: 7 · 2020: 12 · 2019: 6 · 2018: 5 · 2017: 2
- FWCI
- 2.89
- Type
- journal article
- Language
- en
- Open access
- bronze
- doi.org
- Licence
- Locations
- Physical review. B./Physical review. B (publishedVersion)
- Desy publication database (The Deutsches Elektronen-Synchrotron) (submittedVersion, other-oa)
- DESY Publication Database (PUBDB) (Deutsches Elektronen-Synchrotron)
- Funders
- Office of Naval Research (N00014-16-1-2436)
- Topics
- Physical Sciences › Materials Science › Materials Chemistry › Thermal properties of materials
- Physical Sciences › Physics and Astronomy › Atomic and Molecular Physics, and Optics › Magnetic properties of thin films
- Physical Sciences › Engineering › Mechanics of Materials › Thermography and Photoacoustic Techniques
- Keywords
- interfacial thermal conductance, amorphous silica, Si/SiO2 interface, interfacial thermal resistance, metal-dielectric interface, heat transport, nanoscale thermal management
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