Measurement of Thermal Boundary Conductance of a Series of Metal-Dielectric Interfaces by the Transient Thermoreflectance Technique
Abstract
Measurement of the thermal boundary conductance (TBC) by use of a nondestructive optical technique, transient thermoreflectance (TTR), is presented. A simple thermal model for the TTR is presented with a discussion of its applicability and sensitivity. A specially prepared sample series of Cr, Al, Au, and Pt on four different substrates (Si, sapphire, GaN, and AlN) were tested at room temperature and the TTR signal fitted to the thermal model. The resulting TBC values vary by more than a factor of 3 0.71×108-2.3×108 W/m2 K. It is shown that the diffuse mismatch model (DMM) tended to overpredict the TBC of interfaces with materials having similar phonon spectra, while underpredicting the TBC for interfaces with dissimilar phonon spectra. The DMM only accounts for diffuse elastic scattering. Other scattering mechanisms are discussed which may explain the failure of the DMM at room temperature.
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The associated values of G are consistent with prior measurements of a Cr/Si interface.
“The associated values of G, shown in the inset, are consistent with prior measurements of a Cr/Si interface 39 .”
From Broadband phonon mean free path contributions to thermal conductivity measured using frequency domain thermoreflectance (2013) · cites this paper as [39]
The measured thermal interface conductance of AlN and GaN with chromium at T = 300 K is within 20% of prior values.
“Interfaces of AlN and GaN with chromium have been measured at T = 300 K and our results are within 20% of the values29.”
From Universal phonon mean free path spectra in crystalline semiconductors at high temperature (2013) · cites this paper as [29]
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Self-citation
- Authors
- Stevens, R. J., Smith, A. N., & Norris, P. M.
- Affiliations
- University of Virginia (US)
- United States Naval Academy (US)
- Venue
- Journal of Heat Transfer
- Publisher
- Wiley
- Published
- 2005-03-01
- Volume
- 127
- Issue
- 3
- Pages
- 315-322
- ISSN
- 0022-1481 (ISSN-L)
- 1528-8943
- OpenAlex
- W2138697745
- Cited by
- 293
- References
- 3
- Citations by year
- 2026: 10 · 2025: 11 · 2024: 13 · 2023: 10 · 2022: 11 · 2021: 12 · 2020: 16 · 2019: 17 · 2018: 16 · 2017: 21 · 2016: 12 · 2015: 16 · 2014: 11 · 2013: 17 · 2012: 23
- FWCI
- 6.09
- Type
- journal article
- Language
- en
- Open access
- closed
- Locations
- ASME Journal of Heat and Mass Transfer (publishedVersion)
- Funders
- National Science Foundation
- Office of Naval Research
- Topics
- Physical Sciences › Materials Science › Materials Chemistry › Thermal properties of materials
- Physical Sciences › Engineering › Computational Mechanics › Heat Transfer and Numerical Methods
- Physical Sciences › Engineering › Mechanics of Materials › Thermography and Photoacoustic Techniques
- Keywords
- thermal boundary conductance, transient thermoreflectance, metal-dielectric interface, diffuse mismatch model, phonon scattering, thermal modeling, chromium, aluminum, gold, platinum, silicon, sapphire, GaN, aluminum nitride
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