Cited by 285Industrial Vision Systems and Defect DetectionAnomaly Detection Techniques and ApplicationsInfrastructure Maintenance and Monitoring

Anomaly Detection in Nanofibrous Materials by CNN-Based Self-Similarity

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Napoletano, Paolo, Piccoli, Flavio, Schettini, Raimondo·2018·Sensors

Abstract

Automatic detection and localization of anomalies in nanofibrous materials help to reduce the cost of the production process and the time of the post-production visual inspection process. Amongst all the monitoring methods, those exploiting Scanning Electron Microscope (SEM) imaging are the most effective. In this paper, we propose a region-based method for the detection and localization of anomalies in SEM images, based on Convolutional Neural Networks (CNNs) and self-similarity. The method evaluates the degree of abnormality of each subregion of an image under consideration by computing a CNN-based visual similarity with respect to a dictionary of anomaly-free subregions belonging to a training set. The proposed method outperforms the state of the art.

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Research works printed but not linked: 4

  1. [10]Wheeler D.A. Brykczynski B. Meeson R.N. Jr. Software Inspection: An Industry Best Practice for Defect Detection and Removal IEEE Computer Society Press Washington, DC, USA 1996
  2. [41]Krizhevsky A. Sutskever I. Hinton G.E. Imagenet classification with deep convolutional neural networks Advances in Neural Information Processing Systems, Proceedings of the 2012 Annual Conference on Neural Information Processing Systems (NIPS), Stateline, NV, USA, 3–8 December 2012 MIT Press Cambridge, MA, USA 1097 1105
  3. [48]Simonyan K. Zisserman A. Very deep convolutional networks for large-scale image recognition arXiv 2014 1409.1556
  4. [55]Arthur D. Vassilvitskii S. k-means++: The advantages of careful seeding Proceedings of the 18th Annual ACM-SIAM Symposium on Discrete Algorithms New Orleans, LA, USA 7–9 January 2007 1027 1035

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Authors
Napoletano, P., Piccoli, F., & Schettini, R.
Affiliations
University of Milano-Bicocca (IT)
Corresponding author
Napoletano, Paolo
Venue
Sensors
Publisher
MDPI AG
Published
2018-01-12
Volume
18
Issue
1
Pages
209
ISSN
1424-8220 (ISSN-L)
OpenAlex
W2784032999
Cited by
285
References
51
Citations by year
2026: 12 · 2025: 18 · 2024: 36 · 2023: 42 · 2022: 58 · 2021: 55 · 2020: 45 · 2019: 17 · 2018: 2
FWCI
24.65
Type
journal article
Language
en
Open access
Locations
  • Sensors (publishedVersion, cc-by)
  • Europe PMC (PubMed Central) (publishedVersion, cc-by)
  • PubMed Central (publishedVersion, cc-by)
  • PubMed (publishedVersion)
  • BOA (University of Milano-Bicocca) (submittedVersion, cc-by)
  • DOAJ (DOAJ: Directory of Open Access Journals) (submittedVersion, cc-by-sa)
  • Archivio Istituzionale della Ricerca - Università Vita-Salute San Raffaele (submittedVersion)
Topics
  • Physical Sciences › Engineering › Industrial and Manufacturing Engineering › Industrial Vision Systems and Defect Detection
  • Physical Sciences › Computer Science › Artificial Intelligence › Anomaly Detection Techniques and Applications
  • Physical Sciences › Engineering › Civil and Structural Engineering › Infrastructure Maintenance and Monitoring
Keywords
anomaly detection, nanofibrous materials, scanning electron microscopy images, self-similarity, convolutional neural networks, visual similarity, defect detection

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