The DOI matches its Crossref record; 31 of the 31 references it cites were found in a registry or an index.
Thermoreflectance of metal transducers for time-domain thermoreflectance
Abstract
We report measurements of the temperature dependence of the optical reflectivity, i.e., the thermoreflectance dR/dT, of 18 metallic elements at two laser wavelengths commonly used in ultrafast pump-probe experiments, 1.55 μm and 785 nm. The thermoreflectance is determined using time-domain thermoreflectance combined with measurements of the laser power and spot size and comparisons between the data and quantitative modeling of the temperature evolution at the surface of the sample. At a laser wavelength of 1.55 μm, four elements within this set of samples, Nb, Re, Ta, and V, have dR/dT comparable to or larger than 0.6×10−4 K−1. At a laser wavelength of 785 nm, the highest thermoreflectance is found in Al and Ta, dR/dT≈2.1×10−4 K−1 and 2.2×10−4 K−1, respectively. Alloying Au with 5% Pd increases the optical absorption by a factor of 3 and the thermoreflectance by a factor of 2.
Overview
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
Claims other papers make about this one
Each is checked against this paper’s own text: does it say what the citing paper says it does?
In the citing paper
“For a Ti:sapphire oscillator centered around 800 nm, an Al thin layer with a thickness of ~100 nm is a common choice as the transducer layer due to its strong absorption (the 99% absorption depth is <60 nm) 104 and an exceptionally large thermoreflectance coefficient d R /d T ~ 10 -4 K -1 at the 800-nm wavelength. 98, 105, 106”
From Tutorial: Time-domain thermoreflectance (TDTR) for thermal property characterization of bulk and thin film materials (2018) · cites this paper as [105]
Citations
Cites
CRC Handbook of Chemistry and Physics
(2014) · doi:10.1201/b17118 · Cited by 57,706
Optical Constants of the Noble Metals
Johnson, P. B., & Christy, R. W. (1972) · Physical Review B · doi:10.1103/physrevb.6.4370 · Cited by 20,094
Optical constants of transition metals: Ti, V, Cr, Mn, Fe, Co, Ni, and Pd
Johnson, P., & Christy, R. (1974) · Physical review. B, Solid state · doi:10.1103/physrevb.9.5056 · Cited by 1,795
Analysis of heat flow in layered structures for time-domain thermoreflectance
Cahill, D. G. (2004) · Review of Scientific Instruments · doi:10.1063/1.1819431 · Cited by 1,543
Self-citationUltralow Thermal Conductivity in Disordered, Layered WSe 2 Crystals
Chiritescu, C., Cahill, D. G., Nguyen, N., Johnson, D., Bodapati, A., Keblinski, P., & Zschack, P. (2007) · Science · doi:10.1126/science.1136494 · Cited by 854
Self-citationSchmidt, A. J., Chen, X., & Chen, G. (2008) · Review of Scientific Instruments · doi:10.1063/1.3006335 · Cited by 655
Coherent Phonon Generation and Detection by Picosecond Light Pulses
Thomsen, C., Strait, J., Vardeny, Z., Maris, H. J., Tauc, J., & Hauser, J. J. (1984) · Physical Review Letters · doi:10.1103/physrevlett.53.989 · Cited by 581
Electron Diffusion in Metals Studied by Picosecond Ultrasonics
Tas, G., & Maris, H. J. (1994) · Physical Review B · doi:10.1103/physrevb.49.15046 · Cited by 344
Observation of Nonequilibrium Electron Heating in Copper
Eesley, G. L. (1983) · Physical Review Letters · doi:10.1103/physrevlett.51.2140 · Cited by 285
Tessier, G., Holé, S., & Fournier, D. (2001) · Applied Physics Letters · doi:10.1063/1.1363696 · Cited by 157
Research works printed but not linked: 1
- 1981, Physics Data: Optical Properties of Metals
Cited by
Sorted by citations
Nanoscale thermal transport. II. 2003–2012
Cahill, D. G., Braun, P. V., Chen, G., Clarke, D. R., Fan, S., Goodson, K. E., Keblinski, P., King, W. P., Mahan, G. D., Majumdar, A., et al. (2014) · Applied Physics Reviews · doi:10.1063/1.4832615 · Cited by 1,763
Self-citationJiang, P., Qian, X., & Yang, R. (2018) · Journal of Applied Physics · doi:10.1063/1.5046944 · Cited by 424
Hopkins, P. E. (2013) · ISRN Mechanical Engineering · doi:10.1155/2013/682586 · Cited by 302
Effect of Ti interlayer on interfacial thermal conductance between Cu and diamond
Chang, G., Sun, F., Duan, J., Che, Z., Wang, X., Wang, J., Kim, M. J., & Zhang, H. (2018) · Acta Materialia · doi:10.1016/j.actamat.2018.09.004 · Cited by 181
Sun, F., Zhang, T., Jobbins, M. M., Guo, Z. M., Zhang, X., Zheng, Z., Tang, D., Ptasińska, S., & Luo, T. (2014) · Advanced Materials · doi:10.1002/adma.201400954 · Cited by 172
Thermoreflectance of metal transducers for optical pump-probe studies of thermal properties
Wilson, R. B., Apgar, B. A., Martin, L. W., & Cahill, D. G. (2012) · Optics Express · doi:10.1364/oe.20.028829 · Cited by 160
Self-citationAdvanced characterization methods for wear resistant hard coatings: A review on recent progress
Tkadletz, M., Schalk, N., Daniel, R., Kečkéš, J., Czettl, C., & Mitterer, C. (2015) · Surface and Coatings Technology · doi:10.1016/j.surfcoat.2015.11.016 · Cited by 160
A steady-state thermoreflectance method to measure thermal conductivity
Braun, J. L., OLSON, D. H. L., Gaskins, J. T., & Hopkins, P. E. (2019) · Review of Scientific Instruments · doi:10.1063/1.5056182 · Cited by 163
The influence of interface bonding on thermal transport through solid–liquid interfaces
Harikrishna, H., Ducker, W. A., & Huxtable, S. T. (2013) · Applied Physics Letters · doi:10.1063/1.4812749 · Cited by 125
Photothermal phenomenon: Extended ideas for thermophysical properties characterization
Liu, J., Han, M., Wang, R., Xu, S., & Wang, X. (2022) · Journal of Applied Physics · doi:10.1063/5.0082014 · Cited by 111
Zhu, J., Wu, X., Lattery, D. M., Zheng, W., & Wang, X. (2017) · Nanoscale and Microscale Thermophysical Engineering · doi:10.1080/15567265.2017.1313343 · Cited by 93
OLSON, D. H. L., Braun, J. L., & Hopkins, P. E. (2019) · Journal of Applied Physics · doi:10.1063/1.5120310 · Cited by 90
Yuan, C., Hanus, R. C., & Graham, S. L. (2022) · Journal of Applied Physics · doi:10.1063/5.0122200 · Cited by 86
Rocksalt nitride metal/semiconductor superlattices: A new class of artificially structured materials
Saha, B., Shakouri, A., & Sands, T. (2018) · Applied Physics Reviews · doi:10.1063/1.5011972 · Cited by 79
Chang, G., Sun, F., Wang, L., Che, Z., Wang, X., Wang, J., Kim, M. J., & Zhang, H. (2019) · ACS Applied Materials & Interfaces · doi:10.1021/acsami.9b08106 · Cited by 81
Interfacial Thermal Conductance of Transfer‐Printed Metal Films
Oh, D., Kim, S., Rogers, J. A., Cahill, D. G., & Sinha, S. (2011) · Advanced Materials · doi:10.1002/adma.201102994 · Cited by 77
Self-citationCheaito, R., Gorham, C. S., Misra, A., Hattar, K., & Hopkins, P. E. (2015) · Journal of materials research/Pratt's guide to venture capital sources · doi:10.1557/jmr.2015.11 · Cited by 63
Wang, L., Cheaito, R., Braun, J. L., Giri, A., & Hopkins, P. E. (2016) · Review of Scientific Instruments · doi:10.1063/1.4962711 · Cited by 63
Qualitative link between work of adhesion and thermal conductance of metal/diamond interfaces
Monachon, C., Schusteritsch, G., Kaxiras, E., & Weber, L. (2014) · Journal of Applied Physics · doi:10.1063/1.4869668 · Cited by 61
Sun, B., & Koh, Y. K. (2016) · Review of Scientific Instruments · doi:10.1063/1.4952579 · Cited by 57
Self-citationYe, N., Feser, J. P., Sadasivam, S., Fisher, T. S., Wang, T., Ni, C., & Janotti, A. (2017) · Physical review. B./Physical review. B · doi:10.1103/physrevb.95.085430 · Cited by 52
Phonon and electron contributions to the thermal conductivity of VNx epitaxial layers
Zheng, Q., Mei, A. B., Tuteja, M., Sangiovanni, D. G., Hultman, L., Petrov, I., Greene, J. E., & Cahill, D. G. (2017) · Physical Review Materials · doi:10.1103/physrevmaterials.1.065002 · Cited by 50
Self-citationAbove-room-temperature giant thermal conductivity switching in spintronic multilayers
Nakayama, H., Xu, B., Iwamoto, S., Yamamoto, K., Iguchi, R., Miura, A., Hirai, T., Miura, Y., Sakuraba, Y., Shiomi, J., et al. (2021) · Applied Physics Letters · doi:10.1063/5.0032531 · Cited by 48
Chang, G., Sun, F., Wang, L., Zhang, Y., Wang, X., Wang, J., Kim, M. J., & Zhang, H. (2020) · Composites Part A Applied Science and Manufacturing · doi:10.1016/j.compositesa.2020.105921 · Cited by 43
Cheng, Z., Mu, F., Ji, X., You, T., Xu, W., Suga, T., Ou, X., Cahill, D. G., & Graham, S. L. (2021) · ACS Applied Materials & Interfaces · doi:10.1021/acsami.1c06212 · Cited by 43
Self-citationKoh, Y. R., Hoque, M. S. B., Ahmad, H., OLSON, D. H. L., Liu, Z., Shi, J., Wang, Y., Huynh, K., Hoglund, E. R., Aryana, K., et al. (2021) · Physical Review Materials · doi:10.1103/physrevmaterials.5.104604 · Cited by 41
Self-citationFoley, B. M., Gorham, C. S., Duda, J. C., Cheaito, R., Szwejkowski, C. J., Constantin, C., Kaehr, B., & Hopkins, P. E. (2014) · The Journal of Physical Chemistry Letters · doi:10.1021/jz500174x · Cited by 41
Thermal conductivity measurements of sub-surface buried substrates by steady-state thermoreflectance
Hoque, M. S. B., Koh, Y. R., Aryana, K., Hoglund, E. R., Braun, J. L., OLSON, D. H. L., Gaskins, J. T., Ahmad, H., Elahi, M. M. M., Hite, J. K., et al. (2021) · Review of Scientific Instruments · doi:10.1063/5.0049531 · Cited by 39
Self-citationKirsch, D. J., Martin, J. B., Warzoha, R. J., McLean, M. J., Windover, D., & Takeuchi, I. (2024) · Review of Scientific Instruments · doi:10.1063/5.0213738 · Cited by 43
Modeling optical absorption for thermoreflectance measurements
Yang, J., Ziade, E., & Schmidt, A. J. (2016) · Journal of Applied Physics · doi:10.1063/1.4943176 · Cited by 37
Tong, T., Karthik, J., Mangalam, R. V. K., Martin, L. W., & Cahill, D. G. (2014) · Physical Review B · doi:10.1103/physrevb.90.094116 · Cited by 37
Self-citationQuantitative study on thermoreflectance linear relation
Meng, B., Ma, Y., Wang, X., & Yuan, C. (2023) · Journal of Applied Physics · doi:10.1063/5.0164110 · Cited by 37
Assessment of Thermal Properties via Nanosecond Thermoreflectance Method
Garrelts, R. P., Marconnet, A. M., & Xu, X. (2015) · Nanoscale and Microscale Thermophysical Engineering · doi:10.1080/15567265.2015.1078425 · Cited by 34
Hot Electron Thermoreflectance Coefficient of Gold during Electron–Phonon Nonequilibrium
Radue, E., Tomko, J. A., Giri, A., Braun, J. L., Zhou, X., Prezhdo, O. V., Runnerstrom, E. L., Maria, J., & Hopkins, P. E. (2018) · ACS Photonics · doi:10.1021/acsphotonics.8b01045 · Cited by 34
Zheng, W., Huang, B., Li, H., & Koh, Y. K. (2018) · ACS Applied Materials & Interfaces · doi:10.1021/acsami.8b12480 · Cited by 33
Self-citationMohan, R., Khan, S., Wilson, R. B., & Hopkins, P. E. (2025) · Nature Reviews Methods Primers · doi:10.1038/s43586-025-00425-8 · Cited by 38
Quasi-ballistic thermal transport in Al0.1Ga0.9N thin film semiconductors
Koh, Y. R., Shirazi-HD, M., Vermeersch, B., Mohammed, A. M. S., Shao, J., Pernot, G., Bahk, J., Manfra, M. J., & Shakouri, A. (2016) · Applied Physics Letters · doi:10.1063/1.4972186 · Cited by 32
Self-citationZeng, J., Chung, K. M., Wang, Q., Wang, X., Pei, Y., Li, P., & Chen, R. (2021) · International Journal of Heat and Mass Transfer · doi:10.1016/j.ijheatmasstransfer.2021.120989 · Cited by 33
Single element Raman thermometry
Saltonstall, C. B., Serrano, J. R., Norris, P. M., Hopkins, P. E., & Beechem, T. E. (2013) · Review of Scientific Instruments · doi:10.1063/1.4810850 · Cited by 30
Unraveling Phononic, Optoacoustic, and Mechanical Properties of Metals with Light-Driven Hypersound
Zhang, H., Antoncecchi, A., Edward, S., Setija, I. D., Planken, P. C. M., & Witte, S. M. (2020) · Physical Review Applied · doi:10.1103/physrevapplied.13.014010 · Cited by 29
Chen, T., Song, S., Shen, Y. S., Zhang, K., & Jiang, P. (2024) · International Communications in Heat and Mass Transfer · doi:10.1016/j.icheatmasstransfer.2024.107849 · Cited by 28
Park, K., & Bayram, C. (2019) · Journal of Applied Physics · doi:10.1063/1.5126970 · Cited by 26
OLSON, D. H. L., Rost, C. M., Gaskins, J. T., Szwejkowski, C. J., Braun, J. L., & Hopkins, P. E. (2018) · IEEE Transactions on Components Packaging and Manufacturing Technology · doi:10.1109/tcpmt.2018.2863648 · Cited by 26
Ultralow Thermal Conductivity in Nanoporous Crystalline Fe3O4
Kang, J. G., Jang, H., Ma, J., Yang, Q., Hattar, K., Diao, Z., Yuan, R., Zuo, J., Sinha, S., Cahill, D. G., et al. (2021) · The Journal of Physical Chemistry C · doi:10.1021/acs.jpcc.1c00411 · Cited by 25
Self-citationThermal conduction properties of Mo/Si multilayers for extreme ultraviolet optics
Bozorg-Grayeli, E., Li, Z., Asheghi, M., Delgado, G., Pokrovsky, A., Panzer, M. A., Wack, D. C., & Goodson, K. E. (2012) · Journal of Applied Physics · doi:10.1063/1.4759450 · Cited by 25
Rost, C. M., Braun, J., Ferri, K., Backman, L., Giri, A., Opila, E. J., Maria, J.-P., & Hopkins, P. E. (2017) · Applied Physics Letters · doi:10.1063/1.5006648 · Cited by 24
Thermal conductance of silicon interfaces directly bonded by room-temperature surface activation
Sakata, M., Oyake, T., Maire, J. K., Nomura, M., Higurashi, E., & Shiomi, J. (2015) · Applied Physics Letters · doi:10.1063/1.4913675 · Cited by 24
Khan, M. I., Lubner, S., Ogletree, D. F., & Dames, C. (2018) · Journal of Applied Physics · doi:10.1063/1.5050250 · Cited by 23
Measuring sub-surface spatially varying thermal conductivity of silicon implanted with krypton
Pfeifer, T. W., Tomko, J. A., Hoglund, E. R., Scott, E. A., Hattar, K., Huynh, K., Liao, M. E., Goorsky, M. S., & Hopkins, P. E. (2022) · Journal of Applied Physics · doi:10.1063/5.0094876 · Cited by 23
Thermal conductivity of hard oxynitride coatings
Böttger, P. H. M., Lewin, E., Patscheider, J., Shklover, V., Cahill, D. G., Ghisleni, R., & Sobiech, M. (2013) · Thin Solid Films · doi:10.1016/j.tsf.2013.09.094 · Cited by 23
Self-citationTa and Au(Pd) alloy metal film transducers for time-domain thermoreflectance at high pressures
Hsieh, W., & Cahill, D. G. (2011) · Journal of Applied Physics · doi:10.1063/1.3592882 · Cited by 23
Self-citationSimultaneous measurement of thermal conductivity and heat capacity by flash thermal imaging methods
Tao, N. P., Li, X. L., & Sun, J. G. (2017) · Review of Scientific Instruments · doi:10.1063/1.4985633 · Cited by 21
Growth-microstructure-thermal property relations in AlN thin films
Song, Y., Zhang, C., Lundh, J. S., Huang, H., Zheng, Y., Zhang, Y., Park, M., Mirabito, T., Beaucejour, R., Chae, C., et al. (2022) · Journal of Applied Physics · doi:10.1063/5.0106916 · Cited by 20
Thermal diffusivities of MgSiO3 and Al-bearing MgSiO3 perovskites
Ohta, K., Yagi, T., & Hirose, K. (2014) · American Mineralogist · doi:10.2138/am.2014.4598 · Cited by 19
Chiloyan, V., Huberman, S., Maznev, A. A., Nelson, K. A., & Chen, G. (2020) · Applied Physics Letters · doi:10.1063/1.5139069 · Cited by 18
Pfeifer, T. W., Aller, H. T., Hoglund, E. R., Scott, E. A., Tomko, J. A., Ahmad, H., Doolittle, A., Giri, A., Hattar, K., McGaughey, A. J. H., et al. (2024) · Physical review. B./Physical review. B · doi:10.1103/physrevb.109.165421 · Cited by 17
Walton, S. G., Foley, B. M., Hernandez, S. C., Boris, D. R., Baraket, M., Duda, J. C., Robinson, J. T., & Hopkins, P. E. (2016) · Surface and Coatings Technology · doi:10.1016/j.surfcoat.2016.12.085 · Cited by 18
Miandashti, A. R., Khorashad, L. K., Govorov, A. O., Kordesch, M. E., & Richardson, H. H. (2019) · The Journal of Physical Chemistry C · doi:10.1021/acs.jpcc.8b11215 · Cited by 18
Elhajhasan, M., Seemann, W., Dudde, K., Vaske, D., Callsen, G., Rousseau, I., Weatherley, T. F. K., Carlin, J. ‐., Butté, R., Grandjean, N., et al. (2023) · Physical review. B./Physical review. B · doi:10.1103/physrevb.108.235313 · Cited by 17
Pfeifer, T. W., Schonfeld, H. B., Scott, E. A., Aller, H. T., Gaskins, J. T., Olson, D. H., Braun, J. L., Graham, S., & Hopkins, P. E. (2025) · Annual Review of Materials Research · doi:10.1146/annurev-matsci-080423-010435 · Cited by 16
Ultimate-resolution thermal spectroscopy in time domain thermoreflectance (TDTR)
Zenji, A., Rampnoux, J., Grauby, S., & Dilhaire, S. (2020) · Journal of Applied Physics · doi:10.1063/5.0015391 · Cited by 14
Ultrafast laser-induced guided elastic waves in a freestanding aluminum membrane
Zhang, H., Antoncecchi, A., Edward, S., Planken, P. C. M., & Witte, S. M. (2021) · Physical review. B./Physical review. B · doi:10.1103/physrevb.103.064303 · Cited by 14
Gengler, J. J., Roy, S., Jones, J. G., & Gord, J. R. (2012) · Measurement Science and Technology · doi:10.1088/0957-0233/23/5/055205 · Cited by 14
Effect of Crystallinity on Thermal Transport in Textured Lead Zirconate Titanate Thin Films
Varghese, R., Harikrishna, H., Huxtable, S. T., Reynolds, W. T., & Priya, S. (2014) · ACS Applied Materials & Interfaces · doi:10.1021/am500482r · Cited by 12
Tkadletz, M., Lechner, A., Schalk, N., Sartory, B., Winkler, M., & Mitterer, C. (2020) · Surface and Coatings Technology · doi:10.1016/j.surfcoat.2020.125763 · Cited by 12
Zhang, Z., Chang, Z., Fan, X., Zhou, J., Wang, X., Li, G., Zhang, X., Zhu, J., & Tang, D. (2021) · iScience · doi:10.1016/j.isci.2021.102990 · Cited by 11
Liu, Y., Xu, S., Wang, Y., & Dong, H. (2022) · International Journal of Thermophysics · doi:10.1007/s10765-022-03058-1 · Cited by 11
Self-citationKokkinos, D., Gailly, P., Georges, M. P., Tzeremes, G. D., Rochus, P., & Fleury-Frenette, K. (2015) · Applied Optics · doi:10.1364/ao.54.010579 · Cited by 11
Yang, H. F., Hu, X., Liebing, N., Böhnert, T., Costa, J. D., Tarequzzaman, M., Ferreira, R., Sievers, S., Bieler, M., & Schumacher, H. W. (2017) · Applied Physics Letters · doi:10.1063/1.4985434 · Cited by 9
Accurate Thermal Conductivity Measurements of Porous Thin Films by Time-Domain Thermoreflectance
Walwil, H. M., Zhao, Y., & Koh, Y. K. (2024) · ACS Applied Materials & Interfaces · doi:10.1021/acsami.3c13418 · Cited by 9
Self-citationHow to Measure Hot Electron and Phonon Temperatures with Time Domain Thermoreflectance Spectroscopy?
Grauby, S., Montes, B. V., Zenji, A., Rampnoux, J., & Dilhaire, S. (2022) · ACS Photonics · doi:10.1021/acsphotonics.2c01361 · Cited by 8
Heat diffusion in magnetic superlattices on glass substrates
Hoveyda, F., Adnani, M., & Smadici, S. (2017) · Journal of Applied Physics · doi:10.1063/1.5002669 · Cited by 8
Thermal conductivity of low-dimensional materials: Recent progress, prospects, and challenges
Sheraz, A., Korotchenkov, O. A., Nasiri, M. A., de la Torre, M. A. L., & Cantarero, A. (2025) · Applied Physics Reviews · doi:10.1063/5.0274620 · Cited by 7
Thermal performance of materials for heat-assisted magnetic recording
Xu, X., Zhang, C., Guo, S., Seaton, N. C. A., Mkhoyan, K. A., Roth, J., Gong, J., Zheng, X., Zuckerman, N., & Wang, X. (2025) · Journal of Applied Physics · doi:10.1063/5.0258288 · Cited by 6
Non‐Equilibrium Magnon Engineering Enabling Significant Thermal Transport Modulation
Hirai, T., Morita, T., Biswas, S., Uzuhashi, J., Yagi, T., Yamashita, Y., Kushwaha, V. K., Makino, F., Modak, R., Sakuraba, Y., et al. (2025) · Advanced Functional Materials · doi:10.1002/adfm.202506554 · Cited by 6
Zhang, Y., Ren, Q., Fang, J., Liu, J., Wang, S., Song, J., & Zhao, P. (2024) · Physical review. B./Physical review. B · doi:10.1103/physrevb.109.l041407 · Cited by 6
Experimental considerations of CVD diamond film measurements using time domain thermoreflectance
Bougher, T. L., Yates, L., Cheng, Z., Cola, B. A., Graham, S. L., Chaeito, R., Sood, A., Ashegi, M., & Goodson, K. E. (2017) · I-THERM :/I-THERM - Intersociety Conference on Thermal Phenomena in Electronic Systems · doi:10.1109/itherm.2017.7991853 · Cited by 6
Thermal Conductivity and Phonon Transport
Koh, Y. K. (2012) · Springer eBooks · doi:10.1007/978-90-481-9751-4_277 · Cited by 8
Self-citationShi, C., Wang, X., Zheng, Q., Maroske, J., & Thompson, D. (2023) · Optics Express · doi:10.1364/oe.511938 · Cited by 5
Thermal Characterization of Ferroelectric Al1–xBxN for Nonvolatile Memory
Kang, K., Casamento, J. A., Shoemaker, D. C., Song, Y., Ozdemir, E., McIlwaine, N. S., Maria, J., Choi, S., & Trolier-McKinstry, S. E. (2024) · ACS Applied Materials & Interfaces · doi:10.1021/acsami.4c14022 · Cited by 5
Resonant enhancement of the thermoreflectance response of silicon nanodisks
Wang, X., Shi, C., Zheng, Q., & Thompson, D. (2025) · Applied Physics Letters · doi:10.1063/5.0276240 · Cited by 5
Enhanced imaging of electronic hot spots using quantum squeezed light
An, H., Amiri, A. N., Goronzy, D. P., Wetten, D. A. G., Bedzyk, M. J., Shakouri, A., Hersam, M. C., & Hosseini, M. (2024) · Applied Physics Letters · doi:10.1063/5.0215372 · Cited by 4
Ma, G., Meng, B., Zhou, S., Mao, Y., Ma, Y., Xiao, X., & Yuan, C. (2024) · Measurement · doi:10.1016/j.measurement.2024.116247 · Cited by 4
Investigation of film-thickness dependent thermal conductivity of Gd2Zr2O7 thin films
Kang, J.-G., Hong, K.-S., & Yang, H. (2013) · Current Applied Physics · doi:10.1016/j.cap.2013.08.011 · Cited by 4
Experimental and numerical investigation of phonon mean free path distribution
Zeng, L. (2013) · DSpace@MIT (Massachusetts Institute of Technology) · Cited by 4
Characterization of AlF3-passivated aluminum mirrors using non-contact thermal metrology
Jones, A. H., Gaskins, J. T., Hopkins, P. E., Walton, S. G., Boris, D. R., Murphy, J. P., Marcos, L. R.-D., Hoyo, J. G. D., & Quijada, M. A. (2025) · Review of Scientific Instruments · doi:10.1063/5.0241547 · Cited by 3
Progress in measuring, modeling, and manipulating thermal boundary conductance
Norris, P. M., Larkin, L. S., Le, N. Q., Polanco, C. A., Smoyer, J. L., & Zhang, J. (2021) · Advances in heat transfer · doi:10.1016/bs.aiht.2021.07.001 · Cited by 4
Quiambao-Tomko, K. F., White, R. R., Tomko, J. A., Rost, C. M., Backman, L., Opila, E. J., & Hopkins, P. E. (2022) · Journal of Applied Physics · doi:10.1063/5.0069094 · Cited by 3
Selective Phonon Stimulation Mechanism to Tune Thermal Transport
Kumar, G., & Chung, P. W. (2022) · ACS Omega · doi:10.1021/acsomega.1c07364 · Cited by 3
Wavelength dependence of thermoreflectance coefficient of TiNi thin film
Murakami, T., Shimofuri, M., Tsuchiya, T., & Miyake, S. (2025) · Japanese Journal of Applied Physics · doi:10.35848/1347-4065/adb299 · Cited by 3
Analysis of the Thermo-Reflectivity Coefficient Influence Using Photothermal Pump–Probe Techniques
Zanuto, V. S., Capeloto, O. A., Sandrini, M., Malacarne, L. C., Astrath, N. G. C., & Bialkowski, S. E. (2016) · Applied Spectroscopy · doi:10.1177/0003702816662888 · Cited by 2
Hoque, M. S. B., Brummel, I. A., Hoglund, E. R., Dionne, C. J., Aryana, K., Tomko, J. A., Gaskins, J. T., Hirt, D., Smith, S. W., Beechem, T. E., et al. (2023) · Physical Review Materials · doi:10.1103/physrevmaterials.7.025401 · Cited by 2
An Outlook on Power Electronics Reliability and Reliability Monitoring
Martin, H., Smits, E. C. P., Poelma, R. H., van Driel, W. D., & Zhang, G. (2024) · Springer eBooks · doi:10.1007/978-3-031-59361-1_10 · Cited by 2
Measurements of Thermal Boundary Conductance Across α-GeTe/c-GeTe Interfaces
Warzoha, R. J., Donovan, B., Soule, I., Ruppalt, L. B., & Champlain, J. G. (2020) · I-THERM :/I-THERM - Intersociety Conference on Thermal Phenomena in Electronic Systems · doi:10.1109/itherm45881.2020.9190175 · Cited by 2
Minimizing thermal conductivity in laser deposited multilayers
Döring, F. (2017) · eDiss (Georg-August-Universität Göttingen) · doi:10.53846/goediss-6093 · Cited by 2
Thermoelectric Properties of Polymorphic 2D‐TMDs
Ng, H. K., Zhao, Y., Chi, D., & Wu, J. (2023) · Wiley eBooks · doi:10.1002/9783527838752.ch3 · Cited by 2
Relaxation times of non-Fourier materials using frequency-domain thermoreflectance
de la Rosa, A. C., Esquivel-Sirvent, R., & Becerril, D. (2025) · Journal of Applied Physics · doi:10.1063/5.0257299 · Cited by 1
Phenyl Side Groups Enhance Phonon Transport in Rubrene Crystals
Xu, X., Xu, J., Cai, Y., Chowdhury, N., Zhang, C., Cahill, D. G., Liang, C., Frisbie, C. D., & Wang, X. (2025) · Journal of the American Chemical Society · doi:10.1021/jacs.5c15105 · Cited by 1
Self-citationThermoreflectance Detection of Point Defects Resulting from Focused Ion Beam Milling
Pfeifer, T. W., Hoglund, E. R., Ievlev, A. V., & Hopkins, P. E. (2026) · Advanced Engineering Materials · doi:10.1002/adem.202500373 · Cited by 1
Soliton Generation in Negative Thermal Expansion Materials
Curry, E. B., Lyszak, K., Sheets, D., Occhialini, C. A., Rozman, M. G., & Hancock, J. (2021) · Frontiers in Materials · doi:10.3389/fmats.2021.742195 · Cited by 1
Metadata
- Authors
- Wang, Y., Park, J. Y., Koh, Y. K., & Cahill, D. G.
- Affiliations
- University of Illinois Urbana-Champaign (US)
- Venue
- Journal of Applied Physics
- Publisher
- AIP Publishing
- Published
- 2010-08-15
- Volume
- 108
- Issue
- 4
- ISSN
- 0021-8979 (ISSN-L)
- 1089-7550
- OpenAlex
- W2094737921
- Cited by
- 112
- References
- 31
- Citations by year
- 2026: 4 · 2025: 12 · 2024: 9 · 2023: 6 · 2022: 9 · 2021: 10 · 2020: 6 · 2019: 7 · 2018: 7 · 2017: 10 · 2016: 8 · 2015: 5 · 2014: 7 · 2013: 6 · 2012: 4
- FWCI
- 6.10
- Type
- journal article
- Language
- en
- Open access
- closed
- Locations
- Journal of Applied Physics (publishedVersion)
- Topics
- Physical Sciences › Engineering › Mechanics of Materials › Thermography and Photoacoustic Techniques
- Physical Sciences › Materials Science › Materials Chemistry › Thermal properties of materials
- Physical Sciences › Physics and Astronomy › Atomic and Molecular Physics, and Optics › Laser-Matter Interactions and Applications
- Keywords
- thermoreflectance, time-domain thermoreflectance, optical reflectivity, pump-probe spectroscopy, ultrafast laser heating, niobium, rhenium, tantalum, vanadium, aluminum, gold-palladium alloy, optical absorption, surface temperature evolution
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review