The DOI matches its Crossref record; 5 of the 5 references it cites were found in a registry or an index.
Scaling the Si MOSFET: from bulk to SOI to bulk
Abstract
Scaling the Si MOSFET is reconsidered. Requirements on subthreshold leakage control force conventional scaling to use high doping as the device dimension penetrates into the deep-submicrometer regime, leading to an undesirably large junction capacitance and degraded mobility. By studying the scaling of fully depleted SOI devices, the important concept of controlling horizontal leakage through vertical structures is highlighted. Several structural variations of conventional SOI structures are discussed in terms of a natural length scale to guide the design. The concept of vertical doping engineering can also be realized in bulk Si to obtain good subthreshold characteristics without large junction capacitance or heavy channel doping.>
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Cites
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Metadata
- Authors
- Yan, R.-H., Ourmazd, A., & Lee, K. F.
- Venue
- IEEE Transactions on Electron Devices
- Published
- 1992-07
- Volume
- 39
- Issue
- 7
- Pages
- 1704-1710
- ISSN
- 0018-9383 (ISSN-L)
- OpenAlex
- W2133800303
- Cited by
- 910
- References
- 5
- FWCI
- 11.19
- Type
- journal article
- Language
- en
- Open access
- closed
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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
