Cited by 48Advanced Frequency and Time StandardsScientific Measurement and Uncertainty EvaluationAdvanced Electrical Measurement Techniques

Intermittent optical frequency measurements to reduce the dead time uncertainty of frequency link

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Hachisu, Hidekazu, Ido, Tetsuya·2015·Japanese Journal of Applied Physics

Abstract

The absolute frequency of the 87 Sr lattice clock transition was evaluated with an uncertainty of 1.1 × 10 −15 using a frequency link to the international atomic time (TAI). The frequency uncertainty of a hydrogen maser used as a transfer oscillator was reduced by homogeneously distributed intermittent measurement over a five-day grid of TAI. Three sets of four or five days measurements as well as systematic uncertainty of the clock at 8.6 × 10 −17 have resulted in an absolute frequency of 87 Sr 1 S 0 – 3 P 0 clock transition to be 429 228 004 229 872.85 (47) Hz.

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  1. C. A. Greenhall, Proc. 34th Precise Time and Time Interval Meet., 2002, p. 481.

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Authors
Hachisu, H., & Ido, T.
Affiliations
National Institute of Information and Communications Technology (JP)
Venue
Japanese Journal of Applied Physics
Published
2015-10-15
Volume
54
Issue
11
Pages
112401
ISSN
  • 0021-4922 (ISSN-L)
  • 1347-4065
OpenAlex
W1828427991
Cited by
48
References
35
Citations by year
2026: 1 · 2025: 1 · 2024: 3 · 2023: 3 · 2022: 3 · 2021: 1 · 2020: 5 · 2019: 2 · 2018: 10 · 2017: 9 · 2016: 10
FWCI
4.91
Type
journal article
Language
en
Open access
Locations
  • Japanese Journal of Applied Physics (publishedVersion, cc-by)
  • arXiv (Cornell University) (submittedVersion)
  • arXiv (Cornell University)
Topics
  • Physical Sciences › Physics and Astronomy › Atomic and Molecular Physics, and Optics › Advanced Frequency and Time Standards
  • Social Sciences › Decision Sciences › Statistics, Probability and Uncertainty › Scientific Measurement and Uncertainty Evaluation
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Advanced Electrical Measurement Techniques
Keywords
hydrogen maser, systematic uncertainties, optical frequency metrology

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