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Anomalous Lattice Vibrations of Single- and Few-Layer MoS2

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Lee, Changgu, Yan, Hugen, Brus, Louis E., Heinz, Tony F., Hone, James, Ryu, Sunmin·2010·ACS Nano

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Abstract

Molybdenum disulfide (MoS(2)) of single- and few-layer thickness was exfoliated on SiO(2)/Si substrate and characterized by Raman spectroscopy. The number of S-Mo-S layers of the samples was independently determined by contact-mode atomic force microscopy. Two Raman modes, E(1)(2g) and A(1g), exhibited sensitive thickness dependence, with the frequency of the former decreasing and that of the latter increasing with thickness. The results provide a convenient and reliable means for determining layer thickness with atomic-level precision. The opposite direction of the frequency shifts, which cannot be explained solely by van der Waals interlayer coupling, is attributed to Coulombic interactions and possible stacking-induced changes of the intralayer bonding. This work exemplifies the evolution of structural parameters in layered materials in changing from the three-dimensional to the two-dimensional regime.

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Authors: Lee, C., Yan, H., Brus, L. E., Heinz, T. F., Hone, J., & Ryu, S.
Venue: ACS Nano
Publisher: American Chemical Society (ACS)
Published: 2010-04-14
Volume: 4
Issue: 5
Pages: 2695-2700
ISSN: 1936-0851 (ISSN-L)
1936-086X
DOI: 10.1021/nn1003937
OpenAlex: W2134580768
Cited by: 4,859
References: 23
FWCI: 40.00
Type: journal article
Language: en
Open access: green

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Anomalous Lattice Vibrations of Single- and Few-Layer MoS2

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