Student or educator? Sign up with your school email and get 6 months of Pro free.
Cited by 17,923

The DOI matches its Crossref record.

Applied Regression Analysis

·2005·Technometrics

Abstract

Basic Prerequisite Knowledge. Fitting a Straight Line by Least Squares. Checking the Straight Line Fit. Fitting Straight Lines: Special Topics. Regression in Matrix Terms: Straight Line Case. The General Regression Situation. Extra Sums of Squares and Tests for Several Parameters Being Zero. Serial Correlation in the Residuals and the Durbin--Watson Test. More of Checking Fitted Models. Multiple Regression: Special Topics. Bias in Regression Estimates, and Expected Values of Mean Squares and Sums of Squares. On Worthwhile Regressions, Big F's, and R 2 . Models Containing Functions of the Predictors, Including Polynomial Models. Transformation of the Response Variable. Dummy Variables. Selecting the Best Regression Equation. Ill--Conditioning in Regression Data. Ridge Regression. Generalized Linear Models (GLIM). Mixture Ingredients as Predictor Variables. The Geometry of Least Squares. More Geometry of Least Squares. Orthogonal Polynomials and Summary Data. Multiple Regression Applied to Analysis of Variance Problems. An Introduction to Nonlinear Estimation. Robust Regression. Resampling Procedures (Bootstrapping). Bibliography. True/False Questions. Answers to Exercises. Tables. Indexes.

Overview

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Integrity signals

Registry

Crossref · 10.1198/tech.2005.s303

Cites

Statistics

Verification

Claims the paper makes

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Self-check

Percentages, sums and reported differences re-computed from the paper’s own numbers.

The self-check needs the paper’s full text.

Citations

Cited by

Metadata

Venue
Technometrics
Published
2005-08
Volume
47
Issue
3
Pages
380-380
ISSN
  • 0040-1706 (ISSN-L)
  • 1537-2723
OpenAlex
W2034562813
Cited by
17,923
References
0
FWCI
659.76
Type
journal article
Language
en
Open access
closed

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review

Data sources

Bibliographic data: Semantic Scholar, OpenAlex, Crossref.

Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.