Cited by 424Thermal properties of materialsThermography and Photoacoustic TechniquesMechanical and Thermal Properties Analysis

The DOI matches its Crossref record; 234 of the 234 references it cites were found in a registry or an index; 46 of the 193 sources its claims cite were checked for support.

Tutorial: Time-domain thermoreflectance (TDTR) for thermal property characterization of bulk and thin film materials

Open access
Jiang, Puqing, Qian, Xin, Yang, Ronggui·2018·Journal of Applied Physics

Abstract

Measuring thermal properties of materials is not only of fundamental importance in understanding the transport processes of energy carriers (electrons and phonons in solids) but also of practical interest in developing novel materials with desired thermal properties for applications in energy conversion and storage, electronics, and photonic systems. Over the past two decades, ultrafast laser-based time-domain thermoreflectance (TDTR) has emerged and evolved as a reliable, powerful, and versatile technique to measure the thermal properties of a wide range of bulk and thin film materials and their interfaces. This tutorial discusses the basics as well as the recent advances of the TDTR technique and its applications in the thermal characterization of a variety of materials. The tutorial begins with the fundamentals of the TDTR technique, serving as a guideline for understanding the basic principles of this technique. Several variations of the TDTR technique that function similarly as the standard TDTR but with their own unique features are introduced, followed by introducing different advanced TDTR configurations that were developed to meet different measurement conditions. This tutorial closes with a summary that discusses the current limitations and proposes some directions for future development.

Overview

AI snapshot

Written from the paper’s full text.

TL;DR

This tutorial reviews time-domain thermoreflectance (TDTR) for measuring thermal properties of bulk and thin-film materials and interfaces, covering principles, variations, advanced configurations, and limitations. It presents TDTR as a versatile ultrafast pump-probe technique capable of measuring thermal conductivities from ~0.03 to ~2000 W m⁻¹ K⁻¹ and interface conductances from ~8 to ~3700 MW m⁻² K⁻¹.

Key findings

  • TDTR can simultaneously determine through-plane thermal conductivity and interface conductance; benchmark bulk measurements from 0.2 to 2000 W m⁻¹ K⁻¹ agree with literature values within ±8%.
  • Frequency-dependent TDTR can simultaneously determine thermal conductivity and heat capacity; bulk Si heat capacity agreed within ±5%, standard bulk samples overall within ±8%, and dual-frequency TDTR improved thin-film Kz accuracy by ~3 times, reducing a ~20% Cu-film discrepancy to agreement with four-point measurements.
  • Anisotropic configurations extend TDTR: variable spot size requires Kr > 5 W m⁻¹ K⁻¹; beam-offset measured ZnO in-plane Kr = 38.5 W m⁻¹ K⁻¹; elliptical-beam measured ZnO Ka = 46 W m⁻¹ K⁻¹ and Kc = 56 W m⁻¹ K⁻¹.
  • TDTR has been applied across broad ranges, including ultralow ~0.03 W m⁻¹ K⁻¹ for disordered WSe₂ films, high ~2000 W m⁻¹ K⁻¹ for diamond, lowest interface conductance ~8 MW m⁻² K⁻¹ for Bi/hydrogen-terminated diamond, and highest ~3700 MW m⁻² K⁻¹ for Al/Cu.

Methods

  • Tutorial/review design: explains TDTR basics, thermal transport modeling, signal processing, variations (FDTR, TR-MOKE, ASOPS), and advanced configurations for simultaneous K/C, thermally thin films, anisotropic transport, and phonon mean free path probing, with 23 figures and 244 references.
  • Data/sample: no new primary dataset; synthesizes literature and example measurements, including GaN, Si, Cu, ZnO, SiGe, superlattices, polymers, and other bulk/thin-film systems.
  • Main analysis: describes frequency-domain heat diffusion in multilayer stacks, quadrupole method, lock-in detection, sensitivity coefficients, uncertainty propagation, and benchmark comparisons.

Limitations

  • Stated: TDTR requires optically smooth surfaces, with a rule-of-thumb RMS roughness <15 nm; modulation frequency is typically 0.2–20 MHz and spot size 1–30 µm, limiting in-plane Kr <5 W m⁻¹ K⁻¹ and thermally thin films; monolayer/few-layer 2D materials cannot currently be measured; diffusion-equation analysis assumes equilibrium and may fail when mean free paths are comparable to characteristic lengths; low-temperature <30 K and high-temperature Al transducer <600 K measurements are challenging.
  • Stated: no convincing approach has yet appeared for reconstructing phonon mean free paths; rough samples require alternative bonding or TR-MOKE approaches that are not rigorously proven.
  • Evident: as a tutorial/review, conclusions rely on cited studies and example datasets rather than a single controlled new experiment, and quantitative uncertainties vary by configuration and sample.

Model-written summary. Check it against the paper before relying on it.

Integrity signals

Registry

Crossref · 10.1063/1.5046944

Cites

234 of 234 references verified0 citation errors · 0 not checkable

Statistics

Nothing to recompute.

Verification

Claims the paper makes

46 of 193 cited sources checked · 32 supported · 0 flagged · accuracy not yet measured

  • Probably not a substantial claim. 37
  • It may state two separate claims as one. 61
  • The quote only partly states this claim. 1
89 of 89
  • The authors state this as an assumption.

    The additional electrical resistivity of the metal film as compared to its pure bulk counterpart is dominantly caused by impurity scattering, which is temperature-independent.

    “the additional electrical resistivity of the metal film as compared to its pure bulk counterpart is assumed to be dominantly caused by impurity scattering, which is temperature-independent.”
  • The authors state this as an assumption.

    The heat capacities of the metal transducer film and the sub-layers are the same as their bulk counterparts.

    “The heat capacities of the metal transducer film and the sub-layers are usually assumed to be the same as their bulk counterparts 5 and can be obtained from the literature.”
  • The authors state this as an assumption.

    Both the laser profile and the thermal properties of the sample are axisymmetric rather than in-plane anisotropic.

    “In this basic model, both the laser profile and the thermal properties of the sample are assumed to be axisymmetric rather than in-plane anisotropic (see Section IV(C));”
  • The authors state this as an assumption.

    The different phonon modes are in thermal equilibrium so that effective thermal properties Kr, Kz, C, and G can be assumed for each layer.

    “and the different phonon modes are assumed to be in thermal equilibrium so that effective thermal properties Kr , Kz , C, and G can be assumed for each layer.”
  • The authors state this as an assumption.

    The governing equation for anisotropic heat diffusion in cylindrical coordinates for a multilayered system is based on Fourier's law of heat conduction with apparent thermal property values assumed.

    “The governing equation, which is based on Fourier's law of heat conduction with apparent thermal property values assumed, is written as:”
  • The authors state this as an assumption.

    A Dirac delta function for the laser pulses is assumed, valid considering the ultrashort pulse duration (<500 fs) compared to the interval between pulses (~12.5 ns).

    “Assuming a Dirac delta function for the laser pulses, which is a valid assumption considering the ultrashort pulse duration (&lt;500 fs) compared to the interval between pulses (~12.5 ns)”
  • The paper relies on this without support.

    The heating and sensing occur on the top surface of the sample.

    “both the heating and sensing occur on the top surface of the sample;”
  • The authors state this as an assumption.

    The DC component of the pump heating can be neglected in the mathematical model for simplicity.

    “The reason is that the DC component of the pump heating is neglected in the mathematical model here for simplicity (similar to the practice in Ref. 24).”
  • The paper relies on this without support.

    The lock-in amplifier rejects the DC component of the pump heating in TDTR experiments.

    “This simplification is justified because the DC component is rejected by the lock-in amplifier in TDTR experiments.”
  • The authors state this as an assumption.

    The superlattice sample can be treated as a homogeneous thin film with thickness h_film and an effective thermal conductivity.

    “The superlattice sample is treated as a homogeneous thin film with thickness h film and an effective thermal conductivity.”
  • The authors state this as an assumption.

    In variable spot size TDTR, the through-plane thermal conductivity Kz is the same for the two sets of measurements.

    “the validity of this approach relies on the assumption that Kz is the same for the two sets of the measurements.”
  • The authors state this as an assumption.

    For well-studied condensed materials, the bulk heat capacity can be used for thin films because nanostructures do not significantly change the heat capacity.

    “This is usually a reasonable assumption for most of the well-studied condensed materials (e.g., Al, Si, SiO2, etc.) since the nanostructures do not significantly change the heat capacity. 177”
  • The authors state this as an assumption.

    The thermal model used in variable spot size TDTR assumes cylindrical symmetry.

    “the thermal model assumes a cylindrical symmetry.”
  • The paper relies on this without support.

    The thermal conductivity of some semiconductor materials extracted from TDTR experiments was found to depend on the modulation frequency or the laser spot size.

    “The thermal conductivity of some semiconductor materials extracted from TDTR experiments was found to depend on the modulation frequency or the laser spot size”
  • The paper relies on this without support.

    Most analyses of TDTR data to-date are based on solutions of the diffusion equation with the assumption that all the thermal excitations are in equilibrium with each other and a temperature field is well defined.

    “Most analyses of TDTR data to-date are based on solutions of the diffusion equation with the assumption that all the thermal excitations are in equilibrium with each other and a temperature field is well defined.”
15 of 15

Self-check

Percentages, sums and reported differences re-computed from the paper’s own numbers.

Each contradiction between two passages listed here was confirmed by an independent check.

  • Nominal Co/Pt multilayer totals 20 nm, not 19 nm

    Minor

    The specified stack has a 1 nm Pt layer, six repetitions of 0.5 nm Co plus 1 nm Pt, and a 10 nm Pt layer. These thicknesses total 20 nm rather than the stated 19 nm.

    Reported 19 · recomputed 20

  • FDTR phase subtraction has the wrong sign

    Minor

    The stated pump phase is the instrumentation phase minus the reference phase, while the probe phase also includes the thermal phase. Subtracting probe from pump therefore gives the negative of the thermal phase, not the thermal phase as stated.

2 of 2

Citations

Cites

Flagged first, then by citations

Show all 230 references

Research works printed but not linked: 10

  1. 2010, Materials Science in Microelectronics I: The Relationships Between Thin Film Processing and Structure
  2. 2007, Nano/Microscale Heat Transfer
  3. 2004, Thermal Conductivity: Theory, Properties, and Applications
  4. A. J. Schmidt , Ph.D. thesis, Massachusetts Institute of Technology, 2008.
  5. 1991, Handbook of Optical Constants of Solids
  6. 1959, Conduction of Heat in Solids
  7. 2000, Thermal Quadrupoles: Solving the Heat Equation Through Integral Transforms
  8. 2000, The Fourier Transform and Its Applications
  9. 2014, Length-Scale Dependent Phonon Interactions, 137
  10. 2002, The Scientist and Engineer's Guide to Digital Signal Processing

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Metadata

Authors
Jiang, P., Qian, X., & Yang, R.
Affiliations
University of Colorado Boulder (US)
Venue
Journal of Applied Physics
Published
2018-10-28
Volume
124
Issue
16
ISSN
  • 0021-8979 (ISSN-L)
  • 1089-7550
OpenAlex
W2810725316
Cited by
424
References
230
Citations by year
2026: 69 · 2025: 81 · 2024: 77 · 2023: 46 · 2022: 49 · 2021: 51 · 2020: 34 · 2019: 16 · 2018: 1
FWCI
9.21
Type
journal article
Language
en
Open access
Locations
  • Journal of Applied Physics (publishedVersion)
  • arXiv (Cornell University) (submittedVersion)
  • OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information) (submittedVersion)
  • arXiv (Cornell University)
Funders
  • National Science Foundation (0635579, 0846561, 1512776)
  • Defense Advanced Research Projects Agency (FA8650-15-1-7524, FA9550-08-1-0078, FA9550-11-1-0109, FA9550-11-C-0034)
  • Small Business Innovative Research and Small Business Technology Transfer (DE-AR DE-AR0000743)
Topics
  • Physical Sciences › Materials Science › Materials Chemistry › Thermal properties of materials
  • Physical Sciences › Engineering › Mechanics of Materials › Thermography and Photoacoustic Techniques
  • Physical Sciences › Engineering › Mechanical Engineering › Mechanical and Thermal Properties Analysis
Keywords
time-domain thermoreflectance, thin films, bulk materials, ultrafast laser heating, thermal conductivity, thermal diffusivity, phonon transport, electron transport, interfaces, energy storage and conversion

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